摘要 : Increasing IC densities necessitate diagnosis methodologies with enhanced defect locating capabilities. Yet the computational effort expended in extracting diagnostic information and the stringent storage requirements constitute m... 展开
作者 | Ozgur Sinanoglu Alex Orailoglu |
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作者单位 | |
英文名称 | Efficient RT-Level Fault Diagnosis |
期刊名称 | 《计算机科学技术学报(英文版)》 |
期刊英文名称 | 《Journal of Computer Science and Technology》 |
页码/总页数 | 166-174 / 9 |
语种 | 汉语 |
关键词 | fault diagnosis RT-level diagnosis fault dictionary fault simulation dictionary compaction fault bit location tracing |
收录情况 | CSCD |